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Negative-bias temperature instability
Results: 19

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11	CrossMark_Color_Stacked_p Add to Reading List Source URL: www.pskl.ust.hk Language: English - Date: 2014-10-10 03:22:20 Matter Plasma processing Thin film deposition Ceramic materials Semiconductor devices Negative bias temperature instability Chemical vapor deposition Amorphous silicon Polycrystalline silicon Chemistry Semiconductor device fabrication Manufacturing
12	TF.1 Evaluation of Self-Heating and Hot Carrier Degradation of Poly-Si Thin-Film Transistors Using Charge Pumping Technique Add to Reading List Source URL: www.pskl.ust.hk Language: English - Date: 2014-10-10 02:44:39 Semiconductor device fabrication Semiconductors Semiconductor devices Hot carrier injection Negative bias temperature instability MOSFET Transistor Reliability Gate oxide Electronic engineering Electromagnetism Condensed matter physics
13	Microsoft Word - PR-NBTI_June7 Add to Reading List Source URL: www.ridgetopgroup.com Language: English - Date: 2010-06-14 19:17:54 Integrated circuits Hot carrier injection Semiconductors Negative bias temperature instability Transistor Semiconductor intellectual property core Electronic engineering Electronics Electromagnetism
14	Microsoft Word - Bernstein Handbook - Nicholls Mods.doc Add to Reading List Source URL: www.theriac.org Language: English - Date: 2013-06-24 10:52:29 Semiconductors Semiconductor device fabrication Semiconductor devices Failure Hot carrier injection Negative bias temperature instability Reliability MOSFET Threshold voltage Electronic engineering Electromagnetism Technology
15	Microsoft Word - johnres.doc Add to Reading List Source URL: www.nist.gov Language: English - Date: 2011-10-03 11:43:47 Electronic engineering Semiconductor device fabrication High-k dielectric Transistors Negative bias temperature instability Hot carrier injection MOSFET QBD Integrated circuit Electronics Technology Electromagnetism
16	Microsoft PowerPoint - WCM2011_698 [Compatibility Mode] Add to Reading List Source URL: www.techconnectworld.com Language: English - Date: 2011-07-25 10:32:22 Semiconductor device fabrication Semiconductors Electronic design Integrated circuits MOSFET Negative bias temperature instability Hot carrier injection Transconductance Threshold voltage Electromagnetism Electronics Electronic engineering
17	IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, VOL. 25, NO. 8, AUGUST[removed]Gate-Length Biasing for Runtime-Leakage Control Puneet Gupta, Student Member, IEEE, Andrew B. Kahng, Member Add to Reading List Source URL: nanocad.ee.ucla.edu Language: English - Date: 2010-08-13 22:10:56 Digital electronics Electronic design automation Integrated circuits Logic families MOSFET Subthreshold conduction Leakage CMOS Negative bias temperature instability Electronic engineering Electrical engineering Electromagnetism
18	Microsoft Word - IPC Apex11 paper Ver_2_4 (EJW) Add to Reading List Source URL: www.dfrsolutions.com Language: English - Date: 2012-11-27 15:12:38 Failure Reliability engineering Maintenance Semiconductors Semiconductor device fabrication Reliability Hot carrier injection Electromigration Negative bias temperature instability Electronic engineering Systems engineering Technology
19	PDF Document Add to Reading List Source URL: w2.cadence.com Language: English - Date: 2006-09-10 18:38:53 Integrated circuits Electronic design Semiconductor device fabrication Semiconductors Negative bias temperature instability Hot carrier injection Transistor model Electronic circuit simulation Reliability Electronic engineering Electronics Electromagnetism

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